Principal Photo Metrology Engineer – Overlay & HVM Leader

Micron Technology, Inc.

Singapore

On-site

SGD 140,000 - 190,000

Full time

14 days+

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Job summary

Micron Technology, Inc. in Singapore is seeking a Principal/Senior Engineer to lead high-volume manufacturing photo metrology, focusing on overlay metrology yield, quality, productivity, and cost improvements.

You will act as the technical authority resolving complex metrology issues across fabs and guide supplier engagements to align roadmaps. This role requires advanced degree and 5+ years for Senior or 8+ years for Principal in semiconductor photolithography, with hands-on expertise in

Qualifications

BS/MS/PhD in Electrical Engineering, Physics, Materials Science, Chemical Engineering, or related field.
5+ years (Senior) or 8+ years (Principal) experience in semiconductor photolithography.
Hands-on experience in photo/overlay metrology engineering.
Experience deploying Best Known Methods (BKM) across tools, nodes, or fabs.
Strong data-driven approach and cross-functional communication.

Responsibilities

Lead HVM photo/overlay metrology yield, quality, productivity, and cost improvement initiatives.
Resolve complex photo/overlay metrology issues through data-driven root-cause analysis.
Define and deploy Best Known Methods (BKM) across fabs for HVM and NPI.
Act as the technical point of contact for cross-fab, complex photo/overlay metrology concerns.
Drive MOR–POR gap closure and cross-fab/node alignment with internal teams and suppliers.