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Micron Technology in California is seeking an experienced design-for-test (DFT) lead for high‑bandwidth memory (HBM) SoC base‑die designs. You will own DFT architecture, implement scan, MBIST/LBIST, and JTAG, and collaborate with RTL, synthesis, and physical design to enable manufacturability and silicon bring‑up.
The role emphasizes early DFT definition, CDC checks, ATPG readiness, and cross‑group reviews, with mentoring for engineers and contributions to future HBM generations.
Micron Technology in California is seeking an experienced design-for-test (DFT) lead for high‑bandwidth memory (HBM) SoC base‑die designs. You will own DFT architecture, implement scan, MBIST/LBIST, and JTAG, and collaborate with RTL, synthesis, and physical design to enable manufacturability and silicon bring‑up.
The role emphasizes early DFT definition, CDC checks, ATPG readiness, and cross‑group reviews, with mentoring for engineers and contributions to future HBM generations.