Senior Silicon Failure Analysis Engineer (DFT/ATPG & Debug)

Intel Corporation

Hillsboro (OR)

Hybrid

USD 142,000 - 269,000

Full time

2 days ago
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Benefits offered by this job

Stock bonuses
Health benefits
Retirement plan
Paid vacation

Job summary

Intel Corporation is seeking an experienced Product Failure Analysis Engineer – SCAN Design for Test in Hillsboro, OR. The role focuses on root-cause analysis of silicon failures, leveraging DFT architectures, ATPG, scan diagnosis, and post-silicon debugging to accelerate ramp and quality of Intel Foundry products.

You will collaborate with design, test, process development, and manufacturing teams, develop innovative debugging tools, and drive continuous improvement in failure analysis

Qualifications

  • Bachelor’s degree in electrical engineering or related STEM field with 6+ years hands-on experience.
  • Hands-on experience with DFT tools and techniques, SCAN ATPG, and Scan Chain Diagnosis.
  • Experience with fault isolation techniques and debug automation.

Responsibilities

  • Lead Failure Analysis using lab equipment to isolate microscopic silicon failures and identify root causes.
  • Drive cross-functional collaboration with test/validation engineers, designers, and manufacturing teams to resolve quality issues.
  • Develop new debug tools, methodologies, and technologies to advance silicon debugging capabilities.
  • Ensure design-for-debug features are incorporated for deep silicon isolation.
  • Support continuous improvement with input on failure analysis investigations and process improvements.

Skills

DFT
ATPG
Scan Diagnosis
Post-silicon Debug
Root-cause Analysis
Cross-functional Collaboration

Education

Bachelor’s degree in electrical engineering
Master’s degree in electrical engineering
PhD in Electrical/Related STEM

Tools

Siemens Tessent
Synopsys TestMAX/TetraMAX
Verdi
DVE
Python
Perl
TCL

Job description

Intel Corporation is seeking an experienced Product Failure Analysis Engineer – SCAN Design for Test in Hillsboro, OR. The role focuses on root-cause analysis of silicon failures, leveraging DFT architectures, ATPG, scan diagnosis, and post-silicon debugging to accelerate ramp and quality of Intel Foundry products.

You will collaborate with design, test, process development, and manufacturing teams, develop innovative debugging tools, and drive continuous improvement in failure analysis

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