Senior Semiconductor Test Engineer - ATE & Test Development

Integra Technologies.; Wichita (KS); On-site; USD 100,000 - 150,000; Full time

Job summary

Integra Technologies, located in Wichita, KS, seeks a Principal Test Engineer to lead semiconductor test development and ensure specifications meet customer requirements. You will design and evaluate test programs, develop ATE hardware/software, and work cross-functionally with sales and operations to quote and implement test solutions.

ITAR compliance and US citizenship/Green Card are required. The role requires 7–10 years of IC test experience on ATE platforms (Teradyne, Advantest,

Qualifications

• Plan, design and evaluate test development projects for semiconductor devices.
• Develop and program Automated Test Equipment (ATE) hardware and software to test devices per plans.
• Configure bench lab equipment to meet test requirements.

Responsibilities

• Develop semiconductor component-level test plans ensuring coverage of device specs.
• Develop ATE test programs and hardware/software for test platforms.
• Coordinate with Sales to cost quote test development hours and hardware.
• Work with Operations to assess feasibility and cost for production-level test programs.
• Resolve issues using test characterization data to drive corrective actions.

Skills

Test planning

ATE programming

Test data analysis

Laboratory equipment

Customer collaboration

Project management

Education

Bachelor's degree in Electrical Engineering

Tools

Teradyne

Advantest

LTX-Credence

Job description

Integra Technologies, located in Wichita, KS, seeks a Principal Test Engineer to lead semiconductor test development and ensure specifications meet customer requirements. You will design and evaluate test programs, develop ATE hardware/software, and work cross-functionally with sales and operations to quote and implement test solutions.

ITAR compliance and US citizenship/Green Card are required. The role requires 7–10 years of IC test experience on ATE platforms (Teradyne, Advantest,