Senior RF/Analog Test Engineer - DFT & ATE Expert

NXP Semiconductors NV; Chandler (AZ); In loco; USD 120.000 - 160.000; Tempo pieno

Descrizione del lavoro

NXP Semiconductors NV in Chandler, AZ is seeking an experienced test engineer to develop production, qualification and characterization test programs for WLAN, BT, and UWB SOC devices on ATE. The role covers design kick-off through production release and problem debugging to improve yield and performance.

Collaborate with Design, Systems and Software teams to drive innovative RF/analog test methods and new DFT concepts; drive cross-team DFT/test engineering approaches across the group and

Competenze

• Degree in Electrical/Computer Engineering (MS or BS).
• Experience with RF/mmWave testing and SOC test methods.
• Strong programming background in C++, Java, Visual Basic.
• Excellent communication and problem-solving skills.
• Self-driven with ability to own multiple project aspects.

Mansioni

• Develop production, qualification and characterization test programs for WLAN, BT, and UWB SOC devices on ATE.
• Develop test from design kick-off to production release.
• Debug design and process-related yield and performance issues.
• Develop new DFT concepts to improve test efficiency and reduce cost.
• Collaborate with Design, Systems and Software teams on RF/analog test methods.
• Drive DFT/test engineering approaches across products and groups.

Conoscenze

C++/Java/Visual Basic

RF & mmWave testing

Communication & problem solving

Self-driven; takes ownership

Team collaboration

Formazione

M.S. or B.S. in Electrical/Computer Engineering

Descrizione del lavoro

NXP Semiconductors NV in Chandler, AZ is seeking an experienced test engineer to develop production, qualification and characterization test programs for WLAN, BT, and UWB SOC devices on ATE. The role covers design kick-off through production release and problem debugging to improve yield and performance.

Collaborate with Design, Systems and Software teams to drive innovative RF/analog test methods and new DFT concepts; drive cross-team DFT/test engineering approaches across the group and