Senior MEMS Production Test Engineer — DOE, Yield & Bonus

SiTime Corp.; United States; On-site; USD 120,000 - 160,000; Full time

Benefits offered by this job

Equity grants

401k plan

Job summary

SiTime Corp. is seeking a Sr. MEMS Production Test Engineer to ensure efficient wafer-level MEMS testing. You will support prober management, probe card debugging, vendor coordination, MES configuration, and DOE-driven yield improvements.

You’ll design data-driven experiments, collaborate with multiple teams, and optimize test coverage and cycle time while maintaining line health and reliability.

Qualifications

• BS/MS/PhD in EE, ME, Physics, or related field.
• 5+ years in semiconductor MEMS or high-volume testing; wafer-level preferred.
• Hands-on with ATE systems, probers, and wafer-level test hardware.
• Experience debugging probe cards: cantilever and vertical pin.
• Proficient in automating test programs using C#, LabVIEW or Python.
• Strong SPC, yield analysis, and wafer probe/test methodologies.
• MEMS fabrication familiarity; wafer sort is a plus.

Responsibilities

• Monitor test performance and troubleshoot equipment daily.
• Manage probers, probe cards, test hardware and programs.
• Coordinate with vendors to resolve issues and implement improvements.
• Maintain, optimize, and validate test programs; improve yield.
• Design and run DOE experiments to improve yield and reduce cycle time.
• Maintain MES workflows for accurate production execution.
• Develop and manage AOI defect-detection recipes.

Skills

Problem solving

DOE design

Test automation

Education

BS in Electrical Engineering

MS in Electrical Engineering

PhD in Physics / Materials Science

Tools

C#

LabVIEW

Python

Job description

SiTime Corp. is seeking a Sr. MEMS Production Test Engineer to ensure efficient wafer-level MEMS testing. You will support prober management, probe card debugging, vendor coordination, MES configuration, and DOE-driven yield improvements.

You’ll design data-driven experiments, collaborate with multiple teams, and optimize test coverage and cycle time while maintaining line health and reliability.