Remote Metrology Systems Support Engineer

Starrett; Laguna Hills (CA); Remote; USD 70,000 - 85,000; Full time

Benefits offered by this job

Medical, dental and vision insurance

Disability coverage

Life insurance

Paid time off and holidays

401(k) with employer matching

Job summary

Starrett Metrology Systems Division | Starrett Kinemetric Engineering, Inc. is seeking a Metrology Systems Technical Support Specialist to join our remote team in the Eastern Time Zone. This full-time role supports customers and distribution partners, with occasional travel to sites; standard hours are 8:00 a.m.–5:00 p.m.

ET, Monday–Friday, and some weekend support. You will triage and resolve hardware, software, calibration, connectivity, and configuration issues for metrology systems,

Qualifications

• Must have an associate degree or technical certification in metrology or related field.
• Strong troubleshooting across hardware, software, networking, and system configuration.
• Excellent written and verbal communication with a customer-focused approach.

Responsibilities

• Triage, prioritize, and resolve customer and Sales cases involving metrology-system hardware, software, calibration, connectivity, and configuration.
• Provide responsive support by phone, email, remote-access tools, web meetings, and occasional on-site visits.
• Own cases through resolution with Level 1–3 escalation and thorough documentation.
• Conduct customer application studies and develop manuals, bulletins, and diagnostic guides.
• Identify recurring issues and contribute to root-cause analysis and corrective actions.

Job description

Starrett Metrology Systems Division | Starrett Kinemetric Engineering, Inc. is seeking a Metrology Systems Technical Support Specialist to join our remote team in the Eastern Time Zone. This full-time role supports customers and distribution partners, with occasional travel to sites; standard hours are 8:00 a.m.–5:00 p.m.

ET, Monday–Friday, and some weekend support. You will triage and resolve hardware, software, calibration, connectivity, and configuration issues for metrology systems,