Module Metrology Engineer - High-Volume Manufacturing

Intel Corporation; Rio Rancho (NM); On-site; USD 76,000 - 146,000; Full time

Job summary

Intel Corporation in Albuquerque, NM seeks a Module Engineer in Metrology to develop, optimize, and maintain high-volume manufacturing processes and equipment for advanced semiconductor fabrication.

You will work with cross-functional teams to improve yield, monitor process performance, apply SPC/DOE, and drive continuous improvements in in-line metrology tools and techniques such as ellipsometry and X-ray metrology.

Qualifications

• Minimum: Bachelor’s degree in Engineering, Materials Science, Physics, Chemistry or related field with 2+ years experience, or equivalent.
• Master’s degree preferred and encouraged for advancement.
• Experience implementing process improvements and DOE/SPC methods.
• Strong data analysis and problem-solving skills.
• Hands-on metrology experience with inline measurement techniques.

Responsibilities

• Improve quality, yield, and production efficiency using DOE principles.
• Monitor and adjust equipment for process consistency and scalability in high-volume manufacturing.
• Analyze process performance and respond to excursions to minimize impact on production.
• Apply SPC to maintain control over critical manufacturing parameters.
• Collaborate with cross-functional teams to identify and implement improvements.
• Lead problem-solving efforts and document changes for alignment across teams.

Skills

DOE principles

Statistical process control

Data analysis

Cross-functional collaboration

Education

Bachelor's degree in Engineering or related field

Master's degree in Engineering or related field

Tools

Ellipsometry

X-ray metrology

Optical/WLI metrology

Job description

Intel Corporation in Albuquerque, NM seeks a Module Engineer in Metrology to develop, optimize, and maintain high-volume manufacturing processes and equipment for advanced semiconductor fabrication.

You will work with cross-functional teams to improve yield, monitor process performance, apply SPC/DOE, and drive continuous improvements in in-line metrology tools and techniques such as ellipsometry and X-ray metrology.