Intern: Product Yield Enhancement Engineer (Data & AI)

Micron Technology, Inc; Boise (ID); Hybrid; USD 28,000 - 41,000; Full time

Benefits offered by this job

Medical, dental and vision plans

Paid time-off program

Paid holidays

Job summary

Micron Technology, Inc in Boise, Idaho is seeking an Intern Product Yield Enhancement (PYE) Engineer to support next-generation DRAM devices from design to mass production. You will work with researchers, manufacturing, product engineering and global quality teams on hands-on projects to gain valuable experience with memory systems and the product life cycle while contributing to Micron's business.

The internship is 3 months, offering exposure to failure analysis, data mining, AI-assisted

Qualifications

• Pursuing a bachelor’s degree in Electrical Engineering, Computer Engineering, Physics or Materials Science.
• Strong problem-solving and analytical abilities required.
• Expected graduation date not before Sept 1, 2027.

Responsibilities

• Conduct detailed DRAM electrical and physical failure analysis.
• Identify defects from semiconductor fabrication processes.
• Data mine using statistical analysis, AI-assisted tools, and automation workflows.
• Determine root causes and communicate results with multiple teams.
• Complete a 3-month internship.

Skills

Problem solving

Analytical skills

Data mining

Python

Communication skills

Self-motivation

Education

Bachelor's degree in Electrical Engineering, Computer Engineering, Physics or Materials Science

Tools

Python

AI tools

Automation workflows

Job description

Micron Technology, Inc in Boise, Idaho is seeking an Intern Product Yield Enhancement (PYE) Engineer to support next-generation DRAM devices from design to mass production. You will work with researchers, manufacturing, product engineering and global quality teams on hands-on projects to gain valuable experience with memory systems and the product life cycle while contributing to Micron's business.

The internship is 3 months, offering exposure to failure analysis, data mining, AI-assisted