FIB/SEM Materials Scientist – Night Shift

Eurofins; Milpitas (CA); On-site; USD 120,000 - 130,000; Full time

Benefits offered by this job

Medical insurance

Dental insurance

Vision insurance

401k Matching

Wellness Program

Volunteer Time off

Education Assistance

Fitness Reimbursement

Job summary

Eurofins EAG Laboratories seeks a Scientist with Dual Beam FIB/SEM expertise to advance microscopy investigations for semiconductor and materials characterization projects. You’ll prepare TEM lamellae, perform SEM imaging and EDS analysis on FIB cross-sections to deliver high-quality results for diverse clients.

The role emphasizes collaboration, automation workflow development for lamella prep and imaging, and ensuring data quality and throughput in a fast-paced lab environment while upholding

Qualifications

• MS or PhD in Materials Science and Engineering or related field, or equivalent industrial experience.
• Must have in-depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
• Experience with SEM/EDX, or TEM sample preparation; solid understanding of semiconductor device physics and failure analysis.

Responsibilities

• Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
• Develop automation workflows on Dual Beam systems for lamella prep, cross-sectioning, and imaging.
• Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
• Perform image processing and analysis on 2D/3D FIB/SEM datasets.
• Improve throughput, repeatability, and data quality of Dual Beam services.
• Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.
• Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.

Skills

FIB/SEM imaging

TEM lamella prep

EDX analysis

Image processing

Failure analysis

Semiconductor physics

Communication skills

Cross-functional teamwork

Education

MS or PhD in Materials Science and Engineering or related field

Tools

FIB/SEM systems

TEM lamella prep

EDS

SEM imaging

Job description

Eurofins EAG Laboratories seeks a Scientist with Dual Beam FIB/SEM expertise to advance microscopy investigations for semiconductor and materials characterization projects. You’ll prepare TEM lamellae, perform SEM imaging and EDS analysis on FIB cross-sections to deliver high-quality results for diverse clients.

The role emphasizes collaboration, automation workflow development for lamella prep and imaging, and ensuring data quality and throughput in a fast-paced lab environment while upholding