Dual Beam FIB-SEM Materials Analyst (TEM Prep)

Eurofins; Phoenix (AZ); On-site; USD 78,000 - 90,000; Full time

Benefits offered by this job

401k Matching

Paid Time Off

Wellness Program

Education Assistance

Medical, Dental and Vision Coverage

Job summary

Eurofins EAG Laboratories in Phoenix, AZ is seeking a Materials Analyst for its Dual Beam FIB-SEM group. You will prepare site-specific TEM lamellae and perform SEM imaging to support advanced materials and semiconductor analysis for diverse clients.

Ideal candidates hold an MS in Materials Science or related field, have hands-on FIB-SEM experience, and understand SEM/TEM principles and semiconductor failure analysis.

Qualifications

• MS in Materials Science & Engineering or related field required.
• Hands-on experience with Dual Beam FIB-SEM or equivalent lab exposure.
• Knowledge of SEM/TEM principles.
• Understanding of semiconductor device physics & failure analysis concepts.
• Strong problem-solving and prioritization in a fast-paced lab.

Responsibilities

• Prepare site-specific TEM lamella using Dual Beam FIB-SEM on novel materials and devices.
• Perform SEM imaging to support navigation, preparation and quality checks.
• Manage multiple client samples with adherence to quality standards and timelines.
• Collaborate with team to optimize workflows and maintain consistent output.
• Coordinate with internal teams and clients to align analysis requirements.

Skills

FIB-SEM operation

SEM/TEM knowledge

Semiconductor physics

Problem solving

Prioritization

Team collaboration

Education

MS in Materials Science & Engineering or related field

Tools

Dual Beam FIB-SEM systems

Electron microscopy tools

Job description

Eurofins EAG Laboratories in Phoenix, AZ is seeking a Materials Analyst for its Dual Beam FIB-SEM group. You will prepare site-specific TEM lamellae and perform SEM imaging to support advanced materials and semiconductor analysis for diverse clients.

Ideal candidates hold an MS in Materials Science or related field, have hands-on FIB-SEM experience, and understand SEM/TEM principles and semiconductor failure analysis.