Electro-Mechanical Test Technician - Build & Debug

Fuji Semec Inc.; City of Plattsburgh (NY); On-site; USD 42,000 - 58,000; Full time

Benefits offered by this job

12 paid holidays

Vacation after first year

Job summary

Fuji SEMEC is seeking a dedicated tester in our New York operation to perform testing and debugging of electromechanical components and subsystems. You will work with door operators, DMCUs, DCRPs and related items, following prints and instructions to verify performance.

The role emphasizes hands-on setup, measurement, documentation and safe operation, with 40-hour weeks and overtime as needed. A post-secondary diploma or relevant experience is required, and a strong eye for detail is essential.

Qualifications

• Ability to tell when something is wrong or likely to go wrong with an assembly/subassembly.
• Knowledge of electrical wiring.
• Work well both independently and as part of a team.
• Have neat and legible handwriting.
• Computer proficiency in a Windows environment.

Responsibilities

• Testing and debugging products such as door operators, DMCUs, DCRPs and related tasks.
• Set up and test performance of items per print specs and work instructions.
• Load and control associated software on equipment.
• Read blueprints, schematics, diagrams or technical orders to determine testing methods.
• Inspect, test and adjust units to meet specifications and tolerances.
• Maintain a neat and clean work area and follow safety procedures.

Education

Post-secondary diploma in related field

Job description

Fuji SEMEC is seeking a dedicated tester in our New York operation to perform testing and debugging of electromechanical components and subsystems. You will work with door operators, DMCUs, DCRPs and related items, following prints and instructions to verify performance.

The role emphasizes hands-on setup, measurement, documentation and safe operation, with 40-hour weeks and overtime as needed. A post-secondary diploma or relevant experience is required, and a strong eye for detail is essential.