Test Engineer: Digital & Mixed-Signal ATE Expert

APAR TECHNOLOGIES PTE. LTD.; Singapore; On-site; SGD 52,000 - 78,000; Full time

Job summary

Apar Technologies Pte. Ltd. in Singapore seeks a Test Engineer to develop test programs for digital, PMIC, RF, and mixed-signal devices on ATE platforms.

You will support first-silicon debug, device characterization, and production release, and you will debug JTAG, SCAN, ATPG, MBIST vectors while characterizing devices across PVT conditions. The role requires 2–4 years of relevant experience, solid analog/digital knowledge, hands-on lab work, and strong communication while collaborating with

Qualifications

• Diploma or Degree in Electronics Engineering, Electrical Engineering, or a related discipline.
• 2–4 years of relevant test engineering experience.
• Good knowledge of analog and digital electronics.
• Strong analytical, debugging, and problem-solving skills.
• Ability to perform hands-on testing in a laboratory environment.
• Good written and verbal communication skills.
• Ability to work independently and collaborate with cross-functional teams.

Responsibilities

• Develop test programs for digital, PMIC, RF, and mixed-signal products using ATE platforms.
• Support first-silicon debugging, device characterization, test program bring-up, and production release.
• Debug JTAG, SCAN, ATPG, functional, and MBIST digital test vectors.
• Perform device characterization across process, voltage, and temperature (PVT) conditions.
• Characterize mixed-signal IP such as ADC, DAC, and PLL.
• Support test program handoff, production release, yield improvement, and test time reduction.
• Collaborate with product, design, quality, and foundry engineering teams.

Skills

Analog and digital electronics

Analytical and debugging

Hands-on testing

Communication

Independent and cross-functional

Education

Diploma or Degree in Electronics/Electrical Engineering

Tools

Advantest 93K (SmarTest 7/8)

Teradyne UltraFLEX

Job description

Apar Technologies Pte. Ltd. in Singapore seeks a Test Engineer to develop test programs for digital, PMIC, RF, and mixed-signal devices on ATE platforms.

You will support first-silicon debug, device characterization, and production release, and you will debug JTAG, SCAN, ATPG, MBIST vectors while characterizing devices across PVT conditions. The role requires 2–4 years of relevant experience, solid analog/digital knowledge, hands-on lab work, and strong communication while collaborating with