Technician - F10 Failure Analysis

Micron Technology; Singapore; On-site; SGD 50,000 - 70,000; Full time

Job summary

Micron Technology in Singapore is seeking an engineer to perform cross-section analysis and Scanning Electron Microscopy inspections. The role involves identifying defects through physical failure analysis and collaborating with engineering teams to enhance production efficiency.

Qualified candidates should possess a diploma in Electrical or related fields, have strong analytical skills, and be comfortable working 12-hour night shifts. The position offers the chance to contribute to innovative solutions in advanced technology.

Qualifications

• Proven experience in Failure Analysis related areas is advantageous.
• Ability to work permanent 12-hour night shifts.
• Comfortable handling high-concentration chemicals.

Responsibilities

• Perform cross-section analysis and scanning electron microscopy inspection.
• Identify defects and failure mechanisms through physical failure analysis.
• Collaborate with engineering teams to maintain production tool performance.

Skills

Real-Time Defect Analysis (RDA)

Analytical skills

Communication

Teamwork

AI literacy

Education

Diploma in Electrical/Electronics/Microelectronics/Mechatronics Engineering

Job description

Our vision is to transform how the world uses information to enrich life for all.

Join an inclusive team passionate about one thing: using their expertise in the relentless pursuit of innovation for customers and partners. The solutions we build help make everything from virtual reality experiences to breakthroughs in neural networks possible. We do it all while committing to integrity, sustainability, and giving back to our communities. Because doing so can fuel the very innovation we are pursuing.

Responsibilities

• Perform cross-section analysis and Scanning Electron Microscopy (SEM) inspection to monitor process health and ensure production quality.
• Handle Transmission Electron Microscopy (TEM) sample preparation using Focus Ion Beam (FIB) for detailed TEM inspection.
• Identify defects and failure mechanisms through physical failure analysis using a variety of sample de-processing techniques and a wide range of failure analysis equipment.
• Complete physical fault isolation techniques to pinpoint and resolve issues that may impact production efficiency.
• Collaborate with engineering teams to provide timely feedback and implement solutions to maintain efficient production tool performance.
• Support the analysis of wafers with functional failures by applying various Failure Analysis tools and techniques to isolate defects and identify root causes.
• Preserve comprehensive documentation of analytical findings and approaches to aid continual progress initiatives.
• Integrates AI-assisted tools and insights into daily work to improve efficiency, quality, or effectiveness, exercising sound judgment and complying with organizational standards and legal requirements.
• Contributes to a culture of continuous improvement by identifying, testing, and sharing AI-enabled enhancements within one’s scope of work.

Requirements

• Diploma in Electrical/Electronics/Microelectronics/Mechatronics Engineering or a related field.
• Proven experience in Real-Time Defect Analysis (RDA) or Failure Analysis related areas is advantageous.
• Ability to work permanent 12-hour night shifts to support our around-the-clock operations.
• Comfortable in handling high-concentration chemicals safely and effectively.
• Strong analytical skills with the ability to carefully review details to successfully implement precise analysis techniques.
• Excellent communication and teamwork abilities to thrive in our collaborative environment.
• Ability to apply baseline digital fluency and role‑appropriate AI literacy to use AI‑enabled tools responsibly and effectively for research, analysis, content creation, problem‑solving, operational tasks, and achieving business outcomes.

All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, gender identity, national origin, veteran or disability status.