Senior NAND Test Chip Development Engineer

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE LTD; Singapore; On-site; SGD 150,000 - 210,000; Full time

Job summary

Micron Technology, Inc. in Singapore is seeking a Staff Engineer in the System and Technology Product Group (STPG) to own the end-to-end learning loop of NAND TCV development, including pre-silicon validation, post-silicon characterization, and simulation-to-silicon correlation.

The role requires strong technical judgment and cross-functional collaboration to drive complex issues to resolution. You will collaborate with Design, Technology Development, and Test teams, drive data-driven problem

Qualifications

• PhD/masters/bachelor with semiconductor industry experience.
• Experience with pre-silicon and post-silicon validation for complex designs.
• Ability to independently drive technical issues and cross-functional influence.

Responsibilities

• Own pre-silicon validation and regression for TCV programs.
• Analyze simulation results for architecture and margin sensitivities.
• Own post-silicon validation and silicon learning for TCV devices.
• Lead root-cause analysis of silicon anomalies.
• Define test modes and characterization methodologies.
• Collaborate with Design, Technology Development, Process Integration, and Test teams to accelerate learning.

Skills

CMOS physics

Pre-silicon simulation

Data analysis

DFT / probe testing

AI in engineering data

Education

PhD in EE/Materials/Physics

MS in relevant field

BS in related field

Tools

Python

JMP

Statistical tools

Job description

Micron Technology, Inc. in Singapore is seeking a Staff Engineer in the System and Technology Product Group (STPG) to own the end-to-end learning loop of NAND TCV development, including pre-silicon validation, post-silicon characterization, and simulation-to-silicon correlation.

The role requires strong technical judgment and cross-functional collaboration to drive complex issues to resolution. You will collaborate with Design, Technology Development, and Test teams, drive data-driven problem