Senior Electrical Failure Analysis Engineer-NAND FA Leader

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE. LTD.

Singapore

On-site

SGD 120,000 - 180,000

Full time

3 days ago
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Job summary

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE. LTD. seeks an experienced Electrical Failure Analysis Senior Engineer to diagnose yield-limiting failures in NAND devices.

You will combine bench testing, probe data analysis and physical FA to pinpoint failure mechanisms and accelerate learning. You will lead RCA, develop new FA methods, apply data analytics to large datasets, and deliver clear FA reports and visuals for diverse audiences.

Qualifications

  • MS/PhD in Electrical Engineering or related field required.
  • Proven semiconductor Failure Analysis experience.
  • Strong knowledge of NAND/NOR memory technologies.

Responsibilities

  • Lead electrical failure analysis: characterization, fault isolation, failure verification, and de-processing of devices.
  • Drive root cause analysis of yield-limiting failures using electrical, inline, parametric, probe, and fab data.
  • Develop new FA methodologies and de-processing techniques to improve detection and turnaround.
  • Apply data analytics to large semiconductor datasets to identify failure signatures and trends.
  • Prepare FA reports and visualizations for technical and executive audiences.
  • Collaborate with Process Integration, Yield, Metrology, RDA, and Data Science teams to drive yield improvements.
  • Support technology transfer of layout and architecture fundamentals from R&D to manufacturing.
  • Present results in global forums with cross-functional teams.

Skills

Electrical failure analysis
Bench testing
Probe data analysis
Physical failure analysis
Data analytics
FA reporting
Communication skills
Presentations

Education

M.S./Ph.D. in Electrical Engineering or related field

Tools

SEM
FIB
TEM
EDS
EELS

Job description

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE. LTD. seeks an experienced Electrical Failure Analysis Senior Engineer to diagnose yield-limiting failures in NAND devices.

You will combine bench testing, probe data analysis and physical FA to pinpoint failure mechanisms and accelerate learning. You will lead RCA, develop new FA methods, apply data analytics to large datasets, and deliver clear FA reports and visuals for diverse audiences.

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