NAND Electrical Failure Analysis Engineer

Micron Memory Malaysia Sdn Bhd; Singapore; On-site; SGD 90,000 - 130,000; Full time

Job summary

Micron Technology, Inc. in Singapore is seeking an Engineer for Electrical Failure Analysis (EFA) within QEM PQE. You will analyze die-level failures, build failure models, and drive yield and reliability improvements for NAND memory products.

You will design bench DOEs, run probe tests, and translate results into test and process optimizations while collaborating with cross-functional teams to ensure robust product qualification and manufacturing stability.

Qualifications

• Bachelor’s or Master’s in Electronics/Microelectronics/Materials/Physics/Applied Science.
• Excellent problem-solving and analytical skills.
• Communicate effectively both written and verbal to all levels.
• Able to multi-task complex projects and drive them to completion.
• Strong teamwork and cross-functional collaboration.

Responsibilities

• Perform electrical failure analysis using bench characterization at die, circuit, and transistor levels.
• Construct failure models and root cause understanding for yield, reliability issues, and customer returns.
• Design and execute bench DOE and probe experiments to validate hypotheses and improve yield/quality.
• Translate characterization results into test/process/device optimization solutions.
• Conduct circuit and layout tracing to correlate electrical failure signatures with physical/process limits.
• Support NPI qualification and HVM issue resolution for timely product release.
• Drive data-driven yield improvement with cross-functional teams.
• Develop custom test conditions and methodologies for advanced failure validation and experiments.

Skills

Electrical failure analysis

Bench characterization

Probe testing

DOE methodology

Data analysis

Circuit analysis

Layout tracing

Team collaboration

AI literacy

Education

Electronics/Microelectronics/Materials/Physics degree

Job description

Micron Technology, Inc. in Singapore is seeking an Engineer for Electrical Failure Analysis (EFA) within QEM PQE. You will analyze die-level failures, build failure models, and drive yield and reliability improvements for NAND memory products.

You will design bench DOEs, run probe tests, and translate results into test and process optimizations while collaborating with cross-functional teams to ensure robust product qualification and manufacturing stability.