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Nearfield Instruments seeks a senior semiconductor expert to lead CMP, hybrid bonding, wafer-to-wafer and die-to-wafer integration. You will translate metrology needs into product roadmaps, define critical measurements, and drive new applications and features that deliver value for customers.
You\'ll lead cross-functional teams, engage with customers and partners, and shape R&D directions to improve yield, process stability, and manufacturing performance in high-volume fabs.
Nearfield Instruments (NFI) is a fast-growing, high-tech scale-up. We design, develop, integrate, market, and service advanced metrology machines. Our solutions enable the world’s leading chipmakers to increase production yield and improve device performance—powering smaller, faster, and more energy-efficient electronics.
Nearfield brings together leading experts in science and engineering to develop a unique, high-throughput SPM platform delivering true 3D, sub-nanometer resolution metrology at production scale.
We are looking for a senior semiconductor expert with deep experience in hybrid bonding, chemical mechanical planarization (CMP), and advanced packaging, gained within a leading-edge fab, research institute, or semiconductor equipment company.
This expert will lead Nearfield Instruments’ application and technology direction for CMP, hybrid bonding, wafer-to-wafer and die-to-wafer integration, and advanced packaging. The role will identify the most critical process-control challenges, translate them into clear metrology requirements, and drive the development of new applications, capabilities, and product features that create greater value for customers.