Functional Area: Semiconductor Test Engineering / Product Engineering / ATE
Role Overview
We are looking for a Senior Test Engineer with hands‑on experience in semiconductor ATE test development, characterization, debugging and production testing.
The role involves developing ATE test programs from scratch, integrating test functions and test flows, supporting first-silicon bring‑up, and performing Wafer Sort (WS) and Final Test (FT) activities during NPI. Candidates should have practical experience on at least one of the following ATE platforms: Advantest V93K, Teradyne UltraFLEX or ETS364.
Key Responsibilities
- Develop ATE test programs from scratch for semiconductor devices.
- Develop, integrate and debug test functions and complete ATE test flows.
- Support first-silicon bring‑up for wafer‑level and packaged devices during the NPI phase.
- Plan and execute end‑to‑end engineering activities with Product Engineering, Test, Reliability and Foundry Technology teams.
- Perform Wafer Sort (WS) and Final Test (FT) development and production support.
- Analyze volume test data from FT and WS and define appropriate screening specifications.
- Develop and debug test patterns and test flows for semiconductor products.
- Support schematic development and debugging of test interface hardware.
- Perform characterization and debug of new silicon designs and process technologies.
- Execute testing and characterization of Digital, Analog, Mixed‑Signal and Power Management devices.
- Support High Temperature Operating Life (HTOL), performance and power‑related testing.
- Investigate test failures, silicon behavior and product reliability issues through structured characterization and debugging.
Required Qualifications
- Bachelor's or Master's degree in Electronics, Electrical, Semiconductor Engineering, VLSI or a related engineering discipline.
- 3- 7 years of relevant semiconductor test engineering experience.
- Hands‑on experience with at least one ATE platform:
- ETS364
- Experience developing and debugging semiconductor test programs and test flows.
- Practical experience with Wafer Sort (WS) and Final Test (FT).
- Experience testing Digital, Analog, Mixed‑Signal and/or Power Management ICs.
- Programming experience in C, C++, VB or C#.
Technical Skills
ATE Platforms
ATE Software / Test Environment
Semiconductor Test
- ATE Test Program Development
- Test Flow Development
- Wafer Sort / Wafer Probe
- Final Test
- Product Reliability Testing
- Volume Test Data Analysis
- Device Screening
Device / Product Knowledge
- Digital IC Testing
- Mixed‑Signal Testing
- Power Management IC Testing
Programming
Test & DFT Exposure
- Scan Test
- ATPG
- Memory BIST
- Test Pattern Development and Debug
The original JD specifically calls for Digital, Analog, Power Management and Mixed‑Signal validation at Wafer Sort and Final Test, together with C/C++/VB/C# and SmarTest/IG-XL/Eagle Vision exposure.