Sub-30 nm sample preparation and limited-angle STEM tomography H/F

CEA; Grenoble; Presencial; EUR 10.000 - 13.000; A tiempo parcial

Ventajas ofrecidas por este puesto de trabajo

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Descripción de la vacante

CEA, Grenoble, propose un stage Sub-30 nm de préparation d’échantillons et tomographie STEM limitée en angle pour réduire les effets de projection dans les dispositifs à l’échelle nanométrique. Le stage améliore à la fois la préparation d’échantillons et la caractérisation STEM, avec des lamelles <30 nm réalisées par FIB puis polissage ionique léger.

La tomographie électronique limitée reconstruit la tranche centrale, et les résultats seront comparés à une reconstruction 3D complète utilisant

Formación

• Master 2 en sciences des matériaux ou physique, ou équivalent.
• Compétences en programmation.

Responsabilidades

• Préparer des lamelles FIB sub-30 nm.
• Utiliser la tomographie STEM à angle limité pour réduire les effets de projection.
• Comparer les résultats avec une reconstruction 3D complète utilisant des approches deep-learning.

Conocimientos

Programmation

Educación

Master 2 en sciences des matériaux ou physique, ou équivalent

Herramientas

FIB-SEM

STEM

Deep learning

Descripción del empleo

Sub-30 nm sample preparation and limited-angle STEM tomography H/F

Category

Intrumentation, metrology and control

Contract

Internship

Job title

Sub-30 nm sample preparation and limited-angle STEM tomography H/F

Subject

Prepare sub-30-nm FIB lamellae and use limited-angle STEM tomography to reduce projection effects in nanoscale semiconductor devices.

As semiconductor devices become smaller and more complex, structural information from 2D STEM images becomes harder to interpret because projection effects and overlapping features through conventional FIB lamellae can obscure nanoscale structures.

The internship will improve both sample preparation and STEM characterization. Lamellae thinner than 30 nm will be prepared using FIB milling followed by low-energy argon-ion polishing.

Limited-angle electron tomography will then reconstruct the central slice of the FIB lamella to reduce projection effects. The results will be compared with a full 3D volume reconstructed using deep-learning approaches.

Methods / Means

Electron microscopy (FIB-SEM, STEM), deep-learning approaches

Master 2 in materials science, physics or equivalent, with programming skills.

Site

Grenoble

Job location

France

Location

Grenoble

Prepared diploma

Bac+5 - Master 2

Recommended training

Materials science, physics

PhD opportunity

Oui

General information

Organisation

The French Alternative Energies and Atomic Energy Commission (CEA) is a key player in research, development and innovation in four main areas :

• defence and security,
• nuclear energy (fission and fusion),
• technological research for industry,
• fundamental research in the physical sciences and life sciences.

Drawing on its widely acknowledged expertise, and thanks to its 16000 technicians, engineers, researchers and staff, the CEA actively participates in collaborative projects with a large number of academic and industrial partners.

The CEA is established in ten centers spread throughout France