Senior Applications Engineer - SEM, FIB & Metrology

Applied Materials, Inc.; Santa Clara (CA); On-site; USD 147,000 - 203,000; Full time

Job summary

Applied Materials, Inc. in Santa Clara, CA is seeking a Senior Application Engineer to support advanced materials characterization and failure analysis for semiconductor applications.

You will provide technical leadership, develop workflows, and collaborate with R&D, process engineering, and manufacturing teams. The role involves customer demonstrations, training, and cross-functional collaboration, with hands-on work using SEM, FIB, X-ray techniques, and ICP-MS to drive innovation and tool

Qualifications

• MS or PhD in Materials Science, Physics, Chemistry, Electrical Engineering, or related technical discipline OR BS with significant industry experience.
• Strong hands-on experience with SEM, materials characterization, and failure analysis.
• Experience with image analysis, metrology, and tool troubleshooting.

Responsibilities

• Serve as a subject matter expert for materials characterization and failure analysis techniques.
• Develop characterization workflows for semiconductor devices, packaging, interconnects, and advanced materials.
• Provide expert-level support for customer demonstrations, evaluations, and escalations.
• Collaborate with engineering, marketing, and product management teams to support tool adoption and roadmaps.

Skills

SEM experience

Materials characterization

Failure analysis

Image analysis

Metrology

Tool troubleshooting

Education

MS/PhD in Materials Science/Physics/Chemistry/Electrical Engineering

BS with significant industry experience

Tools

SEM/EDX

FIB

CT-Xray

ICP-MS

Job description

Applied Materials, Inc. in Santa Clara, CA is seeking a Senior Application Engineer to support advanced materials characterization and failure analysis for semiconductor applications.

You will provide technical leadership, develop workflows, and collaborate with R&D, process engineering, and manufacturing teams. The role involves customer demonstrations, training, and cross-functional collaboration, with hands-on work using SEM, FIB, X-ray techniques, and ICP-MS to drive innovation and tool