Nano-Scale Planar Metrology Scientist (X-ray)

National Institute of Standards and Technology; Gaithersburg (MD); Hybrid; USD 90,000 - 130,000; Full time

Job summary

The Material Measurement Laboratory at the National Institute of Standards and Technology (NIST) seeks qualified U.S. citizens to join a team within the CHIPS Nanometer-Scale Planar Reference Materials project.

You will apply advanced X-ray and optical metrology to map properties of thin films on Si and SiC wafers. The position, for one year with renewal options, involves developing structural maps, performing sample preparation, and publishing results in journals.

Qualifications

• Ph. D in physics, materials science, or another related field.
• Background in X-ray measurement technique(s) required, either: X-ray reflectivity, X-ray fluorescence, or X-ray photoelectron spectroscopy.
• Background in programming and/or data modeling using python recommended.
• Familiarity with thin film deposition and clean room access protocols, preferred.
• Strong oral and written communication skills.

Responsibilities

• Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers.
• Use lab-based and synchrotron X-ray characterization methods, to determine the structural properties of thin film samples.
• Use open-source (python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer.
• Perform wafer dicing, cleaning, and packaging of samples for distribution as Research Grade Test Materials
• Publish results in archival scientific journals and present results at topical meetings

Skills

X-ray techniques

Python programming

Thin film deposition

Communication skills

Cleanroom access

Education

PhD in physics or materials science

Job description

The Material Measurement Laboratory at the National Institute of Standards and Technology (NIST) seeks qualified U.S. citizens to join a team within the CHIPS Nanometer-Scale Planar Reference Materials project.

You will apply advanced X-ray and optical metrology to map properties of thin films on Si and SiC wafers. The position, for one year with renewal options, involves developing structural maps, performing sample preparation, and publishing results in journals.