FIB/SEM Technician — Wafer Characterization & TEM Prep

Headway Technologies; Milpitas (CA); On-site; USD 34,853 - 55,104; Full time

Benefits offered by this job

Bonus target

Benefits

Job summary

A leading semiconductor firm located in Milpitas, CA is seeking an experienced FIB/SEM Technician for wafer characterization engineering. This role involves TEM sample preparation using Dual Beam and SEM microscopes, performing failure analysis, and adhering to safety policies. Candidates should have an associate's degree in Electronics or related fields, with two years of hands-on experience in a semiconductor environment. This full-time position offers a competitive hourly rate between $25.30 and $40.00, plus bonuses and benefits.

Qualifications

• Two years of hands-on experience using SEM or FIB/SEM microscopes in a semiconductor environment.
• Proficient in the use of Microsoft Office Applications.
• Knowledge of wafer fabrication principles and processes.

Responsibilities

• Supports wafer characterization and engineering processes.
• Performs failure analysis using SEM or Dual Beam microscopes.
• Participates in continuous improvement initiatives.

Skills

Knowledge of microscopy processes

Analytical skills

Critical thinking

Communication skills

Flexibility and prioritization

Education

Associates degree in Electronics or Industrial Technology

Bachelor’s degree in Engineering, Materials Science, or Physics

Tools

SEM

FIB/SEM

Microsoft Office Applications

Job description

A leading semiconductor firm located in Milpitas, CA is seeking an experienced FIB/SEM Technician for wafer characterization engineering. This role involves TEM sample preparation using Dual Beam and SEM microscopes, performing failure analysis, and adhering to safety policies. Candidates should have an associate's degree in Electronics or related fields, with two years of hands-on experience in a semiconductor environment. This full-time position offers a competitive hourly rate between $25.30 and $40.00, plus bonuses and benefits.