FIB/SEM Microscope Specialist – TEM Prep & Failure Analysis

Headway Technologies

Milpitas (CA)

On-site

USD 34,853 - 55,104

Full time

14 days+

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Benefits offered by this job

Bonus target
Comprehensive benefits

Job summary

A technology solutions company is seeking a FIB/SEM Technician in Milpitas, California. This role includes using Dual Beam microscopes for TEM sample preparation, performing failure analysis, and collaborating with the wafer characterization engineering group. Candidates should have an Associate’s degree in a relevant field, two years of experience in a semiconductor environment, and strong skills in analysis and troubleshooting. Offers a competitive salary and a comprehensive benefits package.

Qualifications

  • Two years of hands-on experience using SEM or FIB/SEM microscopes in a semiconductor environment.
  • Proficient in the use of Microsoft Office applications.
  • Knowledge of microscopy processes and procedures.

Responsibilities

  • Perform sophisticated and high-throughput TEM lamella sample preparation.
  • Assist with troubleshooting and resolving basic microscope issues.
  • Support wafer characterization and engineering processes.

Skills

Knowledge of SEM and FIB/SEM
Data analysis
Effective communication
Problem-solving skills

Education

Associate’s degree in Electronics or Industrial Technology
Bachelor’s degree in Engineering, Materials Science, or Physics (preferred)

Tools

Dual Beam microscope
SEM
Microsoft Office

Job description

TITLE: FIB/SEM TECHNICIAN

D SHIFT: THURSDAY THRU SUNDAY, 7:00PM-7:00AM

FLSA STATUS: NON-EXEMPT

REPORTS TO: SR. MANAGER, WAFER CHARACTERIZATION

Summary

Under the direction of the Sr. Manager of Wafer Characterization, the FIB/SEM Technician provides support to wafer characterization engineering group using Dual Beam microscopes for TEM sample preparation. Other responsibilities include using Dual Beam and/or SEM microscopes to perform failure analysis. This position is located in Milpitas, California.

Description

TITLE: FIB/SEM TECHNICIAN

D SHIFT: THURSDAY THRU SUNDAY, 7:00PM-7:00AM

FLSA STATUS: NON-EXEMPT

REPORTS TO: SR. MANAGER, WAFER CHARACTERIZATION

Summary

Under the direction of the Sr. Manager of Wafer Characterization, the FIB/SEM Technician provides support to wafer characterization engineering group using Dual Beam microscopes for TEM sample preparation. Other responsibilities include using Dual Beam and/or SEM microscopes to perform failure analysis. This position is located in Milpitas, California.

Essential Functions

  • Sophisticated and high-throughput TEM lamella sample preparation
  • Supports wafer characterization and engineering processes to ensure wafer, rowbar, and slider samples are mounted correctly and efficiently for Dual Beam TEM sample preparation
  • Uses SEM or Dual Beam for some imaging and performs failure analysis as needed
  • Assists with trouble-shooting and resolving basic microscope issues
  • Participates in and recommends modifications to procedures or processes in support of continuous improvement initiatives
  • Responds to inquiries from other team members, managers, or departments
  • Adheres to all safety policies and procedures as required
  • Performs other duties of a similar nature or level*

Qualifications

MINIMUM QUALIFICATIONS:

  • Associates degree in Electronics or Industrial Technology and/or equivalent relevant experience; Bachelor’s degree in Engineering, Materials Science, or Physics preferred
  • Two years of hands’ on experience using SEM or FIB/SEM microscopes in a semiconductor environment
  • Knowledge of microscopy processes and procedures
  • Proficient in the use of Microsoft Office Applications

Required Knowledge, Skills, And Abilities

  • Knowledge and ability to use various types of microscopes, including SEM and FIB/SEM
  • Knowledge of wafer fabrication principles and processes
  • Ability to collect and analyze data, present findings, and recommend corrective action
  • Ability to adhere to all safety policies and procedures
  • Ability to communicate effectively with all levels of employees and management
  • Demonstrated critical thinking and analytical skills
  • Demonstrated ability to follow routine verbal or written instructions
  • Demonstrated problem solving and organizational skills
  • Demonstrated time management and prioritization skills
  • Skilled at resolving issues quickly and efficiently
  • Flexible and able to prioritize

The hourly rate for this full-time position is between $25.30-40.00 + bonus target + benefits. Within the range the individual pay may differ depending on additional factors including job responsibilities, job related knowledge, skills, abilities, education, and experience. The hourly pay range shown is subject to change and may be modified periodically.

Working Conditions

The FIB/SEM Technician works primarily in an office environment on D shift, Thursday thru Sunday from 7:00pm-7:00am. The schedule may be altered from time-to-time to meet business or operational needs; may travel from building-to-building as needed. Works in a laboratory environment; wears a lab coat, hair net, gloves, safety glasses, and booties. May be exposed to hazardous conditions, chemicals, fumes, and/or gases during the course of work day; Stands and walks; performs various fine grasping movements, bends, and twists; operates a computer and enters information using a keyboard, operates a telephone, and other office equipment. Spends a significant periods of time using a Dual Beam microscope. May occasionally be required to push, pull, or lift up to 10 pounds.

  • Other duties of a similar nature or level are duties that may be required, but may not be specifically listed in the job description or posting.

TDK/Headway Technologies, Inc. provides equal employment opportunities (EEO) to all employees and applicants for employment without regard to race, color, religion, sex, national origin, age, disability, or genetics. Applicants requiring accommodation in order to complete the application process should contact the Headway Human Resources Department.

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