Senior/Staff Metrology Engineer - FIB, AFM & SEM

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE LTD; Singapore; Presencial; SGD 150.000 - 260.000; Jornada completa

Descripción de la vacante

Micron Technology, Inc. in Singapore seeks a senior Metrology Engineer to lead the development and deployment of advanced metrology applications for 3D NAND process development.

You will own FIB-based methods and related techniques (AFM/SEM/WLI), driving inline detection, process learning, and yield improvements. Role requires 7+ years in semiconductor metrology with hands-on FIB and at least one additional technique.

Formación

• Master's or PhD degree in Materials Science, Mechanical Engineering, Electrical Engineering or Applied Physics.
• Minimum 7 years of semiconductor metrology development experience with ownership of new metrology apps/recipes.
• Minimum 5 years hands-on experience in FIB and at least one of AFM, WLI, SEM.

Responsabilidades

• Own development, qualification, and deployment of advanced metrology applications for 3D NAND process development with emphasis on FIB and AFM/SEM/WLI.
• Develop and implement metrology solutions to close inline detection gaps and accelerate process learning.
• Lead evaluation/qualification/deployment of FOAK metrology techs, assessing measurement capability, accuracy, repeatability, throughput, automation, and manufacturing readiness.
• Establish and drive technology roadmaps aligned with NAND tech requirements and partner with suppliers/industry collaborators.
• Identify and develop modeling opportunities using metrology data analytics, AI/ML, and defect detection to understand failure signatures and impact on yield and reliability.
• Collaborate with Process Integration, Yield, Process Development, and Manufacturing teams to enable rapid technology deployment.

Conocimientos

Analytical thinking

Problem solving

Cross-team collaboration

Leadership/ownership

Educación

Master's or PhD in Materials Science/Mechanical/Electrical/Applied Physics

Herramientas

Focused Ion Beam (FIB)

Atomic Force Microscopy (AFM)

Scanning Electron Microscopy (SEM)

White Light Interferometry (WLI)

Descripción del empleo

Micron Technology, Inc. in Singapore seeks a senior Metrology Engineer to lead the development and deployment of advanced metrology applications for 3D NAND process development.

You will own FIB-based methods and related techniques (AFM/SEM/WLI), driving inline detection, process learning, and yield improvements. Role requires 7+ years in semiconductor metrology with hands-on FIB and at least one additional technique.