Senior NAND Validation Engineer - AI-Driven Test Automation

Micron Technology, Inc.; Singapore; On-site; SGD 90,000 - 130,000; Full time

Job summary

Micron Technology, Inc. in Singapore is seeking an Engineer/Senior Engineer in Product Engineering, NAND Functional and Design Validation Infrastructure (FDV‑Infrastructure) to accelerate silicon validation and infrastructure development.

The role emphasizes automation, data‑driven validation, and AI to boost test efficiency and debugging. Key duties include designing validation flows for RG NAND devices, building test infrastructure, and applying AI/ML techniques to root‑cause analysis and

Qualifications

• Bachelor’s degree in Electronics Engineering, Computer Engineering, or related.
• Experience in silicon validation, failure analysis, and infrastructure development.
• Proficiency in C/C++, Python, and Perl for test automation.

Responsibilities

• Design and execute functional and design validation flows for RG NAND devices.
• Develop and maintain test program infrastructure with deterministic tests and new NAND interfaces.
• Implement automation frameworks using C-based programming, Python, and Perl.
• Apply AI/ML-assisted techniques for data analytics, anomaly detection, and failure triage.
• Use dashboards to track validation progress, defect trends, and release readiness.
• Perform electrical failure analysis and root-cause investigations with cross-functional teams.
• 3-5 years of relevant experience for Senior Engineer positions.

Skills

C/C++

Python

Perl

AI/ML

Data analytics

Education

Bachelor’s degree in Electronics/Computer Engineering

Tools

Teradyne

Advantest

Job description

Micron Technology, Inc. in Singapore is seeking an Engineer/Senior Engineer in Product Engineering, NAND Functional and Design Validation Infrastructure (FDV‑Infrastructure) to accelerate silicon validation and infrastructure development.

The role emphasizes automation, data‑driven validation, and AI to boost test efficiency and debugging. Key duties include designing validation flows for RG NAND devices, building test infrastructure, and applying AI/ML techniques to root‑cause analysis and