Night Shift TEM Engineer - FIB & TEM Specialist

Micron Technology; Singapore; On-site; SGD 60,000 - 90,000; Full time

Benefits offered by this job

Medical, dental, vision plans

Disability & paid family leave

Generous paid time off & holidays

Career development & training

Employee stock purchase plan

Job summary

Micron Technology is seeking a Night Shift TEM Engineer in the YE lab at our Singapore site. You will perform TEM and FIB based sample prep, develop new techniques, and support device analysis to advance new part types. Growth opportunities include operating TEM and expanding knowledge in electron microscopy and semiconductor processing.

Successful candidates will join a team focused on innovation, process development, and technology improvement while ensuring safety and data-security standards.

Qualifications

• B.S. degree in Materials Science, Physics, or related field.
• Comfortable working permanent night shift.
• Strong background in materials science, physics or chemistry.

Responsibilities

• Perform daily FIB and TEM operations to support new technology development.
• Prepare high quality TEM samples using FIB and connect with customers for information.
• Innovate new FIB techniques to meet customers' needs.
• Develop solutions to improve sample preparation efficiency.
• Provide detailed handoffs to the next shift.

Skills

TEM operations

FIB experience

TEM sample prep

Device physics

Independent learner

Education

B.S. in Materials Science or Physics

Tools

TEM

FIB system

Job description

Micron Technology is seeking a Night Shift TEM Engineer in the YE lab at our Singapore site. You will perform TEM and FIB based sample prep, develop new techniques, and support device analysis to advance new part types. Growth opportunities include operating TEM and expanding knowledge in electron microscopy and semiconductor processing.

Successful candidates will join a team focused on innovation, process development, and technology improvement while ensuring safety and data-security standards.