Cleanroom Process Technician – Precision Semiconductor Fab

Low Noise Factory AB; Göteborgs kommun; On-site; SEK 357,120 - 468,720; Full time

Benefits offered by this job

Flexible hours

30 days vacation

Pension plan

Bonus program

Health/wellness benefit

Private medical insurance

Meal benefit

Job summary

Low Noise Factory AB in Gothenburg seeks a detail-oriented candidate for cleanroom fabrication and device metrology. You will perform lithography, etching, deposition, lift-off, and wafer dicing, while measuring devices and logging data for reliability testing.

You will support engineers with new processes and maintain high precision in a state-of-the-art facility. Beneficial skills include hands-on cleanroom experience, operation of lithography and deposition tools, microscopy/metrology, and

Qualifications

• A relevant B.Sc. is preferred but not mandatory.
• Written and spoken English proficiency is required.
• Detail-oriented, precise, and able to follow written procedures.
• Willingness to work in a cleanroom environment.

Responsibilities

• Perform cleanroom fabrication steps including photolithography, etching, deposition, lift-off, and dicing.
• Conduct on-wafer measurements, optical/SEM inspection, and metrology for film thickness and recess.
• Prepare samples, run reliability tests, and log data with clear documentation.
• Provide first-line troubleshooting and support engineers with new processes.

Skills

Attention to detail

English proficiency

Cleanroom work

Education

B.Sc.

Tools

Cleanroom equipment

Job description

Low Noise Factory AB in Gothenburg seeks a detail-oriented candidate for cleanroom fabrication and device metrology. You will perform lithography, etching, deposition, lift-off, and wafer dicing, while measuring devices and logging data for reliability testing.

You will support engineers with new processes and maintain high precision in a state-of-the-art facility. Beneficial skills include hands-on cleanroom experience, operation of lithography and deposition tools, microscopy/metrology, and