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European Synchrotron Radiation Facility (ESRF) invites applications for a PhD- thesis position in physics/engineering. The project focuses on sub-nanosecond imaging of operating microelectronic devices by X-ray diffraction microscopy at ID01 beamline.
The successful candidate will collaborate with European groups to probe thermomechanical behaviour in SiGe(Sn) heterostructures. The role requires a background in X-ray diffraction or electronics, programming with Python, and a clear ability to
Organisation/Company European Synchrotron Radiation Facility Research Field Physics Researcher Profile Established Researcher (R3) Positions PhD Positions Application Deadline 2 Sep 2027 - 23:23 (Europe/Paris) Country France Type of Contract Temporary Job Status Full-time Is the job funded through the EU Research Framework Programme? Not funded by a EU programme Reference Number NS26-ESRF05 Is the Job related to staff position within a Research Infrastructure? No
Thesis subject: Sub Nanosecond Imaging of Operating Microelectronic Devices by X-ray Diffraction Microscopy
Beamline ID01, at the ESRF is a world leading instrument dedicated to micro- and nano-beam X-ray diffraction imaging experiments. It enables advanced studies of epitaxial materials and microelectronic devices, including time-resolved full-field diffraction microscopy. The ID01 team has successfully carried out several lighthouse experiments that attract collaborators and users worldwide.
The successful candidate will join the team and collaborate with a network of European semiconductor device research groups and technology organizations. These partners focus on applied materials and devices in the time domain. In particular, the project addresses key challenges limiting efficiency and life-time of microelectronic and optoelectronic devices based on SiGe(Sn) heterostructures, namely heat generation and strain‑induced degradation during operation. The improvement of device design and fabrication requires an experimental technique capable of probing the spatial and temporal distribution of lattice strain under realistic operating conditions. This can be achieved using X‑ray Diffraction Microscopy in the unique set‑up at ID01.. This project will provide fundamental understanding of thermomechanical behaviour and energy dissipation in technologically and economically relevant semiconductor devices. In addition, it will advance the X‑ray diffraction microscopy methodology toward 3D spatial and temporal strain–temperature imaging for the optimization of next‑generation electronic and optoelectronic devices.
Further information may be obtained from:
Tobias Schülli (tel.: +33 (0)4 76 88 22 80, email: schulli@esrf.fr )
The successful candidate will have to assure to fulfil all conditions and respect deadlines for enrolment in the doctoral school at Department of Sciences, Rome Tre University, Roma, Italy.
The ESRF is an equal opportunity employer and encourages applications from disabled persons.
NEXTSTEP will train 36 enthusiastic researchers to exploit the unique and transversal capabilities of analytical research infrastructures in tackling the challenges associated with sustainable development and industrial competitiveness in the areas of “Health”, “Digital, Industry & Space”, “Climate, Energy and Mobility” and “Food, Bioeconomy, Natural Resources, Agriculture and Environment”, which are at the heart of Horizon Europe. Host laboratories: ESRF and ILL (France), FZJ (Germany), AREA (Italy), NTNU (Norway).