Senior Lithography Metrology Engineer — Scanner Overlay

Micron Technology, Inc.; Boise (ID); On-site; USD 120,000 - 170,000; Full time

Job summary

Micron Technology, Inc. is seeking a Senior Photolithography Scanner Metrology Engineer in Boise to develop, optimize, and sustain metrology solutions ensuring precise overlay and pattern alignment in advanced DRAM manufacturing.

You will work with KLA metrology systems, perform data-driven analysis, troubleshoot overlay issues, and collaborate with process and equipment teams to improve lithography performance across fab operations.

Qualifications

• 5+ years in scanner metrology, overlay, or lithography metrology systems.
• Hands-on experience with KLA metrology tools and overlay techniques.
• Strong understanding of alignment and overlay in advanced photolithography.
• Experience troubleshooting overlay or metrology issues in a fab.
• Bachelor’s or Master’s degree in Engineering or related field; military equivalent or 5+ years exp accepted.
• Willingness to travel internationally for onboarding and training.

Responsibilities

• Develop, optimize, and sustain scanner metrology solutions for photolithography.
• Drive improvements in overlay performance and process control using data-driven analysis.
• Utilize KLA metrology systems to monitor lithography performance and improve yields.
• Collaborate with process, equipment, and integration teams to resolve overlay issues.
• Perform root cause analysis on overlay errors and process variability while improving SPC metrics.

Skills

Scanner metrology

Overlay measurement

Data-driven analysis

Troubleshooting

Education

Bachelor’s or Master’s degree in Engineering or related technical field

Tools

KLA metrology tools

Diffraction-based overlay

Python

SPC

Job description

Micron Technology, Inc. is seeking a Senior Photolithography Scanner Metrology Engineer in Boise to develop, optimize, and sustain metrology solutions ensuring precise overlay and pattern alignment in advanced DRAM manufacturing.

You will work with KLA metrology systems, perform data-driven analysis, troubleshoot overlay issues, and collaborate with process and equipment teams to improve lithography performance across fab operations.