Nondestructive Metrology Research Engineer

Johns Hopkins University

Gaithersburg (MD)

On-site

USD 60,000 - 100,000

Full time

14 days+

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Job summary

Johns Hopkins University in Maryland is seeking a PREP Research Associate to support the CHIPS-funded project on nondestructive defect detection metrology for advanced semiconductor packaging. You will join a multidisciplinary team to develop reference artifacts and benchmark datasets, perform XCT measurements, and help prepare data for publication.

The role requires a bachelor's degree in physics or engineering and at least 5 years of relevant experience, plus skills in XCT, FIB/SEM, CAD

Qualifications

Bachelor's degree in physics, engineering, or related discipline.
At least 5 years of relevant experience.
Experience with XCT measurements, reconstruction, and image analysis.
Experience with sample preparation, FIB and SEM.
Strong oral and written communication skills.

Responsibilities

Prepare samples for focused ion beam or scanning electron microscopy measurements.
Make X-ray computed tomography or laminography measurements.
Design 3D models for simulation, run XCT simulations, carry out XCT reconstruction, and execute image analysis.
Organize and prepare data sets for publication.
Present results at internal meetings and occasional meetings with external stakeholders.
Ensuring that results, protocols, software, and documentation have been archived or otherwise transmitted to the larger organization.