Metrology Intern: Data-Driven Semiconductor Processes

1000 Micron Technology, Inc.; Boise (ID); On-site; USD 25,000 - 39,000; Part time

Benefits offered by this job

Medical / dental / vision benefits

Paid time off

Paid holidays

Job summary

Micron Technology, Inc. in Boise, Idaho, offers a six-month co-op and summer internship in Metrology Technology Development.

You will plan experiments in a cleanroom, analyze metrology data with JMP and Excel, and work with cross-functional teams to solve measurement challenges. Ideal candidates are pursuing MS or PhD in engineering, physics, or materials science, with knowledge of Optical Metrology, X-Ray, Overlay, profiling, and AI-enabled data analysis.

Qualifications

• Currently pursuing an MS or PhD in Engineering, Physics, Materials Science or a related semiconductor field.
• Must be a current student and not graduate before September 2027.
• Strong understanding of Optical Metrology and related techniques.
• Experience applying data science to metrology data and large datasets.

Responsibilities

• Complete two or three Metrology projects and present results to the team.
• Plan, design, and run experiments in a semiconductor cleanroom.
• Analyze metrology data using Excel/JMP and statistical tools.
• Evaluate new metrology tools for cost and performance improvements.
• Collaborate with engineers across sites to support technology transfers.

Skills

Optical Metrology

Data Science

Python

MATLAB

C++

JMP

AI/ML

MS Office

Education

MS or PhD in Engineering/Physics/Materials Science or related field

Tools

JMP

MATLAB

Python

C++

Job description

Micron Technology, Inc. in Boise, Idaho, offers a six-month co-op and summer internship in Metrology Technology Development.

You will plan experiments in a cleanroom, analyze metrology data with JMP and Excel, and work with cross-functional teams to solve measurement challenges. Ideal candidates are pursuing MS or PhD in engineering, physics, or materials science, with knowledge of Optical Metrology, X-Ray, Overlay, profiling, and AI-enabled data analysis.