Metrology Engineer - PIC Wafer Fab

NOKIA; San Jose (CA); On-site; USD 120,000 - 180,000; Full time

Job summary

Nokia's Photonic Integrated Circuit (PIC) wafer fabs in Sunnyvale and San Jose are seeking a Metrology Engineer to sustain and improve wafer fabrication through metrology, defect analysis, and control.

You will work with Process Integration, Manufacturing, Equipment Engineering, and R&D to boost yield, product quality, and manufacturing performance, while training operators on metrology tools.

Qualifications

• BS/MS in Electrical Engineering, Materials Science, Physics or related field.
• 5+ years of semiconductor wafer fabrication experience (7+ preferred).
• Strong problem-solving, data analysis, and communication skills.
• Experience with SPC, failure analysis, and process characterization.
• Hands-on experience with CD-SEM, profilometers, ellipsometers, and defect inspection tools preferred.
• Experience with MES systems is a plus.
• Experience in III‑V semiconductor technologies (InP or GaAs) highly desirable.
• Familiarity with photolithography, etch, deposition, and CVD processes preferred.

Responsibilities

• Develop, qualify, and maintain metrology recipes for CD-SEM, profilometry, overlay, ellipsometry, and defect inspection tools.
• Own and support metrology equipment performance, qualification, and continuous improvement.
• Develop metrology sampling plans and inline monitoring strategies.
• Analyze process and metrology data to characterize processes and improve process control.
• Monitor SPC charts and investigate process excursions using RCCA methodologies.
• Support wafer-level failure analysis, including FIB, EDX, and coordination of external analyses.
• Troubleshoot process and equipment issues in collaboration with Operations and Engineering teams.
• Create equipment specifications, procedures, and OCAP documentation.
• Train operators and technicians on metrology tools and procedures.
• Support new technology development, process qualifications, technology transfers, and production ramp activities.

Skills

Problem-solving

Data analysis

Communication

Statistical process control

Failure analysis

Process characterization

CD-SEM

Profilometer

Ellipsometer

Defect inspection tools

MES systems

III-V technologies

Photolithography/etch/deposition/CVD

Education

BS/MS in Electrical Engineering, Materials Science, Physics or related field

Tools

CD-SEM

Profilometer

Ellipsometer

Defect inspection tools

MES systems

Job description

Nokia's Photonic Integrated Circuit (PIC) wafer fabs in Sunnyvale and San Jose develop and manufacture advanced Indium Phosphide (InP) semiconductor devices. The Metrology Engineer is responsible for sustaining and improving wafer fabrication processes through metrology, process characterization, defect analysis, and process control. This role works closely with Process Integration, Manufacturing, Equipment Engineering, and R&D teams to improve yield, product quality, and manufacturing performance.

Key Responsibilities

• Develop, qualify, and maintain metrology recipes for CD-SEM, profilometry, overlay, ellipsometry, and defect inspection tools.
• Own and support metrology equipment performance, qualification, and continuous improvement.
• Develop metrology sampling plans and inline monitoring strategies.
• Analyze process and metrology data to characterize processes and improve process control.
• Monitor SPC charts and investigate process excursions using RCCA methodologies.
• Support wafer-level failure analysis, including FIB, EDX, and coordination of external analyses.
• Troubleshoot process and equipment issues in collaboration with Operations and Engineering teams.
• Create equipment specifications, procedures, and OCAP documentation.
• Train operators and technicians on metrology tools and procedures.
• Support new technology development, process qualifications, technology transfers, and production ramp activities.

Qualifications

• BS/MS in Electrical Engineering, Materials Science, Physics, or a related field.
• 5+ years of semiconductor wafer fabrication experience (7+ preferred).
• Strong problem-solving, data analysis, and communication skills.
• Experience with statistical process control (SPC), failure analysis, and process characterization.
• Hands-on experience with CD-SEM, profilometers, ellipsometers, and defect inspection tools preferred.
• Experience with MES systems is a plus.
• Experience in III‑V semiconductor technologies (InP or GaAs) is highly desirable.
• Familiarity with photolithography, etch, deposition, and CVD processes preferred.

Work Schedule

Compressed work week: Monday-Wednesday and every other Thursday, 12‑hour day or night shifts.