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Design, develop, test, analyze, troubleshoot and implement mech modules for Scan Electron Microscope (SEM) inspection/other measurement. Systems used advanced semiconductor devices. Design and release advanced Electron-beam Electrical schematic, system panels using Finite Element Analysis (FEA), DFMEA, DFM, DFA principles and applied research for chip manufacturing including for Lithography and metrology systems. Provide Technical Product Documentation with Tolerance Stack up designs and Bill of Materials (BOM).
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