Entry-Level Quality & Reliability Engineer – CMOS Focus

Bzpp; United States; On-site; USD 76,000 - 95,000; Full time

Benefits offered by this job

Medical, dental, and vision insurance

Life insurance

401(k) matching with immediate vesting

Onsite café(s) and workout facilities

Paid maternity and paternity leave

Paid time off (PTO) + holidays

Wellness incentives

Job summary

Samsung Austin Semiconductor is seeking an entry-level E1 Engineer for the Q&R FEOL TQR team to support reliability engineering activities for advanced CMOS technology nodes.

You will perform reliability modeling and monitoring, collaborate with senior engineers on new technology development and qualification, and receive training in wafer-level reliability execution, data analysis and interpretation for long-term chip reliability.

Qualifications

• Bachelor's degree in Engineering (Electrical Engineering, Electronics and Computer Engineering, Materials Science and Engineering) with 0 to 1 year of experience.
• Entry-level role in Quality & Reliability with training in wafer-level reliability, data analysis and interpretation.

Responsibilities

• Reliability modeling and monitoring.
• Work with senior members, for new technology development and qualification.
• New engineer will get training of wafer-level-reliability execution, data analysis, and interpretation, for long-term chip-level reliability of semiconductor product.

Skills

Quality

Reliability

Semiconductor

CMOS

Education

Bachelor's degree in Engineering (Electrical Engineering, Electronics and Computer Engineering, Materials Science and Engineering)

Job description

Samsung Austin Semiconductor is seeking an entry-level E1 Engineer for the Q&R FEOL TQR team to support reliability engineering activities for advanced CMOS technology nodes.

You will perform reliability modeling and monitoring, collaborate with senior engineers on new technology development and qualification, and receive training in wafer-level reliability execution, data analysis and interpretation for long-term chip reliability.