Advanced Research Scientist, Semiconductor Metrology

Nova Ltd.

Fremont (AL)

On-site

USD 160,000 - 240,000

Full time

9 days ago
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Job summary

Nova is seeking a highly accomplished Research Scientist to join our technology organization and drive the exploration and development of advanced technologies for semiconductor materials characterization and metrology.

You will combine deep physics expertise with hands-on experimental research to evaluate emerging technologies, develop advanced characterization concepts, and help shape the next generation of semiconductor metrology solutions.

Qualifications

  • Ph.D. in Physics, Applied Physics, Materials Science, or a closely related field.
  • Extensive research experience in fundamental and applied physics relevant to advanced materials characterization and analytical instrumentation.
  • Deep understanding of semiconductor technology, materials, processes, and metrology requirements.
  • Hands-on experience designing, developing, and operating sophisticated experimental systems and testbeds.

Responsibilities

  • Drive advanced research in materials characterization, semiconductor metrology, and surface science.
  • Develop innovative characterization and measurement concepts based on physics, modeling, and experimental validation.
  • Define and build advanced testbeds and proof-of-concept systems to evaluate new technologies.
  • Collaborate with multidisciplinary teams to translate research into practical metrology solutions.
  • Anticipate future metrology needs and contribute to Nova's technology roadmap.

Skills

XPS
XRF
SEM/EDX
TEM/EDX
EELS
SIMS
Vacuum physics

Education

Ph.D. in Physics

Tools

X-ray sources
X-ray optics
Detector systems
Electron-beam sources
Vacuum systems

Job description

Nova is seeking a highly accomplished Research Scientist to join our technology organization and drive the exploration and development of advanced technologies for semiconductor materials characterization and metrology.

You will combine deep physics expertise with hands-on experimental research to evaluate emerging technologies, develop advanced characterization concepts, and help shape the next generation of semiconductor metrology solutions.

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