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ASML Delft is offering a master's non-thesis internship focused on improving the imaging performance of multi-beam SEM used for wafer inspection. You will work on calibration measurements and data analysis to understand how wafer topography affects image quality and throughput.
The role involves collaboration with software, physics, and systems engineers to develop robust inspection strategies and enhanced imaging performance.
ASML Delft is offering a master's non-thesis internship focused on improving the imaging performance of multi-beam SEM used for wafer inspection. You will work on calibration measurements and data analysis to understand how wafer topography affects image quality and throughput.
The role involves collaboration with software, physics, and systems engineers to develop robust inspection strategies and enhanced imaging performance.