Staff Scientist – Analytical Scanning Transmission Electron Microscopy

European Microscopy Society

Town of Brookhaven (NY)

On-site

USD 110,000 - 170,000

Full time

14 days+
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Job summary

European Microscopy Society (EMS) seeks a Staff Scientist to advance analytical STEM and spectroscopy at Brookhaven's CFN. You will join the Electron Microscopy Group and help commission, optimize, and lead research on two state-of-the-art Nion STEMs arriving 2025–2026.

The role requires a Ph.D. with strong publication record in STEM, plus experience with EELS and data analytics. Collaboration across teams and safety-first lab practices are essential.

Qualifications

  • Ph.D. in Materials Science, Physics, Chemistry, or related engineering field.
  • 2+ years post-Ph.D. experience.
  • Demonstrated impact in aberration-corrected STEM/EELS research and simulation.
  • Technical expertise and interest in STEM instrumentation and optimization.
  • Active engagement in professional societies and regular conference participation.
  • Commitment to safe laboratory practices.

Responsibilities

  • Advance cutting-edge analytical STEM microscopy and spectroscopy in CFN.
  • Commission, optimize, and lead research with two new Nion STEMs arriving in 2025–2026.
  • Collaborate across teams to enable sub-Å EELS analysis and in situ studies.

Education

Ph.D. in Materials Science, Physics, Chemistry, or related engineering field

Tools

Python
Nion STEM systems

Job description

European Microscopy Society (EMS)

European Microscopy Society

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Staff Scientist – Analytical Scanning Transmission Electron Microscopy

Center for Functional Nanomaterials (CFN) – Brookhaven National Laboratory

Upton, NY, USA

Description

The Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory seeks an exceptional scientist to advance cutting-edge analytical scanning transmission electron microscopy (STEM) and spectroscopy. You will join the Electron Microscopy Group and play a central role in commissioning, optimizing, and leading research with two new state-of-the-art aberration-corrected, monochromated Nion STEMs arriving in 2025–2026. These instruments will enable sub-Å EELS analysis, ultra-low keV imaging of sensitive materials, and environmental/operando studies across a broad pressure range.

Requirements
Required Qualifications
  • Ph.D. in Materials Science, Physics, Chemistry, or related engineering field, plus 2+ years post-Ph.D. experience.
  • Demonstrated impact in aberration-corrected STEM/EELS research and simulation, evidenced by strong publication record.
  • Technical expertise and interest in STEM instrumentation and optimization.
  • Active engagement in professional societies and regular conference participation.
  • Commitment to safe laboratory practices.
Preferred Qualifications
  • 4+ years post-Ph.D. experience.
  • Experience with advanced EM techniques (EELS quantification, 4D-STEM, tomography, in situ/operando EM).
  • Experience developing data analytics tools (e.g., Python, machine learning for EM data).
  • Hands‑on experience with Nion STEM systems.
  • Strong communication skills and demonstrated success in interdisciplinary collaborations.
Contact

Lilit Piramzadian

eMail: lpiramzad@bnl.gov

European Microscopy Society (EMS)

Contact: secr@eurmicsoc.org

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