Metrology Process Engineer – Technology Development

Micron Technology, Inc; City of Albany (NY); On-site; USD 90,000 - 120,000; Full time

Benefits offered by this job

Medical, dental, and vision plans

Paid family leave

Robust paid time-off program

Paid holidays

Bonuses and equity options

Job summary

Micron Technology, Inc in Albany, New York, is seeking a Metrology Process Engineer to develop and integrate advanced metrology processes for memory technologies. You will collaborate with experts in process and integration to drive innovations from R&D to manufacturing.

The ideal candidate will have a relevant Master's or PhD degree, experience in semiconductor metrology, and familiarity with data analysis methods. Micron offers competitive benefits including medical plans, paid leave, and equity options.

Qualifications

• M.S. or Ph.D. in Electrical/Electronics Engineering or related field.
• B.S. with semiconductor processing experience focusing on metrology.
• Experience in metrology or semiconductor process development.

Responsibilities

• Develop and integrate metrology processes for memory technologies.
• Perform analysis and optimization of manufacturing processes.
• Document processes and communicate results to teams.

Skills

Metrology techniques

Data analysis and statistical methods

Cross-functional collaboration

Scripting (Python/JMP/SQL)

Education

M.S. or Ph.D. in relevant Engineering or Technical Degree

B.S. with 2+ years of semiconductor processing experience

Tools

Critical dimension measurement tools

EUV photolithography tools

Job description

Metrology Process Engineer – Technology Development

Full‑time position at the NYCreates site in Albany, New York. The role collaborates with Process and Integration experts to qualify Low and High NA EUV lithography processes and other technology development projects that shape future memory technologies. Activities include working with equipment, materials, layouts, and data, and partnering with global suppliers to move innovations from R&D to high‑volume manufacturing.

Responsibilities

• Develop and integrate metrology processes for advanced memory technologies.
• Perform material evaluations, reticle and layout development, OPC, overlay optimization, and process window analysis.
• Drive yield improvement, failure analysis, and device performance optimization.
• Partner with equipment vendors to evaluate tools and improve process capability.
• Document processes, communicate results, and support technology transfer to manufacturing.

Minimum Qualifications

• M.S. or Ph.D. in Electrical/Electronics Engineering, Materials Science, Physics, Chemistry, Chemical Engineering, Computer Engineering, or another relevant Engineering or Technical Degree.
• B.S. with 2+ years of semiconductor processing experience emphasizing metrology is also considered.
• Experience or working knowledge in metrology or semiconductor process development.
• Working knowledge of process characterization, data analysis, and statistical methods.
• Ability to collaborate across cross‑functional technical teams.

Preferred Qualifications

• Experience with metrology techniques including critical dimension measurement, registration measurement, and film characterization.
• Experience working with semiconductor equipment vendors or in R&D environments.
• Experience providing or analyzing metrology solutions specific to EUV photolithography challenges.
• Proficiency in scripting (Python/JMP/SQL) for data analysis and automation.
• Experience using LLM or AI productivity tools.

Benefits

Micron offers choice of medical, dental, and vision plans, income protection programs, paid family leave, a robust paid time‑off program, and paid holidays. Additional benefits may include bonuses and equity.

Equal Employment Opportunity

Micron is a proud equal opportunity employer. All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, age, national origin, citizenship status, disability, protected veteran status, gender identity, or any other factor protected by applicable federal, state, or local laws.