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onsemi seeks a graduate‑level Device Characterization Intern in San Jose to drive wafer‑level measurements and data analysis for next‑gen semiconductor devices. You will automate test and reporting workflows, work with image sensor, ASIC, high‑voltage and analog/mixed‑signal devices, and contribute to AI‑enabled efficiency gains.
The role emphasizes hands‑on measurements, data interpretation, and collaboration with engineering teams in San Jose to advance exploration and validation of
onsemi seeks a graduate‑level Device Characterization Intern in San Jose to drive wafer‑level measurements and data analysis for next‑gen semiconductor devices. You will automate test and reporting workflows, work with image sensor, ASIC, high‑voltage and analog/mixed‑signal devices, and contribute to AI‑enabled efficiency gains.
The role emphasizes hands‑on measurements, data interpretation, and collaboration with engineering teams in San Jose to advance exploration and validation of