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Delft University of Technology in the Netherlands invites applications for a PhD candidate to develop amplitude- and phase-controlled optical metrology for nanoscale semiconductor manufacturing. The project combines first-principles modelling, electromagnetic scattering, signal processing and machine learning.
The position is full-time for four years, with an initial 1.5-year contract, salary EUR 3204–4051 per month, and funding paid.
Delft University of Technology · Faculty of Applied Sciences
Netherlands
Delft University of Technology is recruiting a PhD candidate to develop amplitude- and phase-controlled optical metrology for nanoscale semiconductor manufacturing. Applications close on 15 October 2026 at 23:59 Europe/Amsterdam.
The project develops coherent optical scatterometry methods with full control of the input probe field. It combines first-principles optical modelling, electromagnetic scattering, signal processing, optimisation and machine-learning methods to improve retrieval of nanoscale shape and overlay information.
optical metrology scatterometry semiconductor manufacturing electromagnetic scattering machine learning
Level PhD
Time Commitment Full-time
Duration 4 years; initial 1.5-year contract followed by 2.5 years after a positive go/no-go assessment
Reference Code 3752
Field Optical Metrology and Coherent Scatterometry
Specialization Physics
Organization Type University
Funding & Compensation
Amount EUR 3204-4051 / Per Month
Funding Type Salary
Funding Status Paid
Period Per Month
Applicants should hold an MSc in applied physics, electrical engineering or an equivalent relevant field.
Applicants should have strong theoretical foundations and demonstrable interest in optics, electromagnetic scattering, signal processing and mathematics, together with willingness to work on both theory and experiments.